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Applications of Random Process Excursion Analysis

by Irina S. Brainina

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Random-process excursion analysis for adaptive signal-processing applications

$174.42 USD
$174.42 USD $174.42 USD

Hardcover New English

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AlbakiReads Editorial

Random-process excursion analysis for adaptive signal-processing applications

This applied mathematics monograph examines how the statistical properties of excursions in random processes can be identified and used in engineering analysis. It presents both precise and approximate formulas, connecting theoretical treatment with the design of adaptive signal-processing devices. A central application is signal detection and recognition when the desired signal’s statistical properties are not known in advance and background noise is present. The book also places excursion analysis across a broad technical range, including radiolocation, telecommunications, medical applications, image recognition, semiconductor thermal-noise analysis, surface flaw detection, and mechanical-load calculation.

Good fit for readers who enjoy

  • Engineers working with adaptive signal processing and detection in noise
  • Applied mathematicians studying random processes and statistical excursion methods
  • Researchers in communications, imaging, radiolocation, or reliability-oriented engineering applications

Themes

Random processesExcursion statisticsAdaptive signal processingSignal detection in noiseEngineering applications

Based on publisher information and book metadata.

Book overview

This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period.The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.

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